- ETEL implements XJTAG system at 12,000m² engineering and manufacturing centre in Môtiers, Switzerland
- XJTAG enables ETEL engineers to verify the connections on the multiple high pin count BGA devices on boards used in its advanced digital motion controllers
CAMBRIDGE, England, May 31, 2007 – ETEL, a leading global supplier of direct drive motion control components and integrated systems, has selected the XJTAG boundary scan development system to debug and test complex printed circuit boards (PCBs) used in its market-leading range of advanced digital motion controllers.
The XJTAG system is being used by engineers at ETEL’s 12,000m² engineering and manufacturing centre in Môtiers, Switzerland, to improve and speed up the process of debugging and testing its PCBs, which contain multiple ball grid array (BGA) devices. The XJTAG system is also being used for production testing by ETEL’s contract manufacturing partners.
With subsidiaries throughout Europe and North America, ETEL provides advanced motion control technology to a range of industries from semiconductor and electronics manufacturing to biomedical, machine tools and precision automation. It is the first manufacturer to offer fully digital, interpolated and distributed position control systems for multi-axis, direct drive applications.
Christophe Meier, R&D Engineer at ETEL, said: “The XJTAG system complements our already extensive range of test equipment and will ensure that our products continue to meet our own, and our customers’ exacting quality standards. XJTAG’s boundary scan system features a graphical JTAG analysis and debugging tool which enables our engineers to look beneath and verify the connections on the multiple high pin count BGA devices on our latest range of boards. This is important as these devices are typically inaccessible to traditional test methods such as flying probes, logic analysers, oscilloscopes and X-ray systems.”
Joao De Oliveira, VP business development, XJTAG, said: “We are delighted that the XJTAG system has been selected by ETEL, a market leading supplier of motion control systems and a pioneer in rotary drives and linear motors. XJTAG is easy-to-use, competitively priced, and boasts unparalleled speed and accuracy of fault diagnosis. In addition, test IP is retained because the device-centric test scripts can be ported from project to project and reused at the design and prototyping stage and through to production and beyond.”
The XJTAG development system is a cost-effective ‘out-of-the-box’ solution for debugging, testing and servicing electronic printed circuits boards and systems throughout the product lifecycle. The XJTAG system reduces the time and cost of board development and prototyping by allowing early test development, early design validation of CAD netlists, fast generation of functional tests and test re-use across circuits using the same devices.
XJTAG enables engineers to test a high proportion of the circuit (both boundary scan and cluster devices) including ball grid array (BGA) and chip scale packages, such as SDRAMs, Ethernet controllers, video interfaces, Flash memories, field programmable gate arrays (FPGAs) and microprocessors. XJTAG also enables In-System Programming of FPGAs, complex programmable logic devices (CPLDs) and Flash memories.
For more information about the XJTAG Development System, please contact XJTAG, St John’s Innovation Centre, Cowley Road, Cambridge, CB4 0DS, UK. Telephone +44 (0) 1223 223007, fax +44 (0) 1223 223009 or email enquiries@xjtag.com. Alternatively visit www.xjtag.com.
About ETEL (www.etel.ch)
ETEL S.A. is the leading supplier of direct drive motion control components and integrated systems. Headquartered in Switzerland, and with subsidiaries throughout Europe and North America, ETEL supports high tech industry with linear motors, torque motors, positioning stages, and motion controllers.
About XJTAG (www.xjtag.com)
XJTAG is a leading supplier of IEEE Std. 1149.1 compliant boundary scan development tools. Its JTAG (Joint Test Action Group) development system offers a highly competitive solution for designers and developers of electronic circuits. Utilising XJTAG allows the circuit development and prototyping process to be shortened significantly by facilitating early test development, early design validation, fast development of functional tests and test re-use across circuits that use the same devices. XJTAG is based in Cambridge, UK, and is part of the Cambridge Technology Group (www.cambridgetechgroup.com).
What is JTAG?
Advances in silicon design, such as increasing device density and, more recently, ball grid array (BGA) and chip scale packaging, have made traditional electronic circuit testing methods hard to use. In order to overcome these problems and others; some of the worlds leading silicon manufacturers combined to form the Joint Test Action Group (JTAG). The findings of this group were used as the basis for the Institute of Electrical and Electronic Engineers (IEEE) standard 1149.1: Standard Test Access Port and Boundary Scan Architecture.
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