Excellent fault diagnostics & fast programming for the production line.
Deliver proven, high-quality circuit boards faster and more cost-effectively with XJTAG’s integrated test development environment.
Test without Test Points
Go where no bed-of-nails can
Faster Fault Finding
Build on the features of Boundary Scan
Lower NRE Costs
Simplify your test systems
Flexible Integration
Make XJTAG part of your total test solution
Go where no bed-of-nails can. Boundary scan enabled devices give XJTAG access to their pins, turning them into virtual test points. Physical access is no longer a limiting factor, allowing you to test more of your design.
XJTAG products make accessing Boundary Scan simple through the powerful Connection Test and extensive Built-in Library of Tests for thousands of non-JTAG devices. Without any test points you can easily test connections between BGA devices, such as a bus between two JTAG devices or a JTAG device and its memory.
Using XJTAG you can test more of your design, including the function of many non-JTAG devices, to rapidly locate and resolve manufacturing faults.
Using XJTAG you can effectively:
- Overcome test access limitations
- Test without physically probing
- Verify connectivity of BGA & fine-pitch devices
Relevant Features:
XJEase Advanced Connection Test
XJTAG’s unique technology builds on the features of Boundary Scan to provide a production-ready solution for rapid fault detection and correction. You can increase yield by finding more faults more quickly, and reduce rework by accurately identifying the problem first time, improving test cycle time.
The software products provide visualisation features to help engineers ‘see’ faults, including a Schematic Viewer that shows you your circuit, a Layout Viewer that highlights nets exhibiting a fault, and Waveform Viewer that displays digital signals.
Develop tests quickly using XJDeveloper, run the tests in XJRunner and further analyse the results using the powerful diagnostic features of XJInvestigator. The innovative Fault Dictionary provides an easy way of documenting and sharing the symptoms and root causes of common faults as they are discovered, making future fault finding even more effective.
Using XJTAG you can rapidly:
- Find faults on assembled PCBs
- Visually locate faults, quickly
- Document and share faults and their root causes
Relevant Features:
Layout Viewer Schematic Viewer
Every aspect of our technology is designed to be easy to learn, simple to use and cost-effective to deploy. XJTAG products reduce the cost of developing expensive test fixtures and complex test systems giving you dual savings on non-recurring engineering (NRE) costs.
Simplify your test systems by using Boundary Scan to reduce the number of probes needed in a test fixture while still maintaining or improving test coverage.
Save test development time using the Built-in Library of Test Models and intuitive user interface. Quickly generate tests to identify and resolve faults in prototype or production boards. Free up expensive production equipment by being able to develop and debug a test system with nothing more than a PC.
Use XJTAG throughout the product lifecycle: move the entire test system from the development bench to your production line without incurring any additional costs.
Using XJTAG you can:
- Reduce test fixture cost & complexity
- Save test development time
- Reuse tests throughout the product lifecycle
Relevant Features:
Advanced Connection Test Fault Dictionary
Make XJTAG Boundary Scan part of your total test solution: integration support is provided for all of the major test executives, as well as proprietary systems.
Examples for running XJTAG tests from TestStand, LabView™ and LabWindows™ are provided with all XJTAG systems, as are examples for how to use C# to access the underlying .NET interface. Tests can also be run from the command line so any test executive software capable of making a system call can integrate with XJTAG.
If you are using in-circuit testers, we have certified solutions for integrating XJTAG’s software and Boundary Scan controllers into the Keysight i3070 (with support for tests written in BT-Basic) and the Teradyne TestStation. XJTAG also has a full integration that extends SPEA’s Flying Probe or Bed-of-Nails functionality to include concurrent ICT and Boundary Scan testing.
Using XJTAG you can simply:
- Integrate with TestStand, LabView and LabWindows
- Interface to ICT systems such as Keysight i3070 and Teradyne TestStation
- Extend the capabilities of SPEA flying probe or bed-of-nails systems
Relevant Features:
XJAPI Custom Integration
More about XJTAG Software XJTAG Hardware
XJTAG can save valuable time from the early stages of product development. Read about using XJTAG for Fast Prototype Board Bring-Up & Debug
