XJTAG DFT Assistant for OrCAD Capture

Visualize the extent of JTAG test access to devices in your design and extend test coverage even further. Identify and correct potential JTAG testability problems within OrCAD® Capture before having any hardware produced so you can reduce expensive board re-spins and project delays.
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Tubitak Uzay case study

XJTAG boundary scan helps us easily localise any problems, which saves time and simplifies PCBA rework.” Ufuk Onder Senior, Hardware Design Engineer – TUBITAK UZAY Read case study

Osatu Bexen case study header

XJTAG is very competitively priced and easy to use, and provides convenient features like the Advanced Connection Test. XJTAG’s reliability and repeatability is also a strong point on the production line. We can trust XJTAG to make consistent judgements every time. Gorka Landaburu, R&D Manager – Osatu / Bexen Read case study

Eaton case study header

XJTAG has features that are vastly superior to other systems I know. The learning curve for new users is dramatically shorter. James Diem, Test Engineering Manager – Eaton Read case study

CRFS case study header

XJTAG is an absolute necessity for any company designing complex circuits that feature high pin count BGA or chip scale devices. XJTAG is easy to use and incredibly fast, which has enabled us to shave weeks off the development schedule for our RFeye module thereby freeing our development team from time-consuming debugging tasks. Alistair Massarella, CEO – CRFS Read case study

ARM case study header

The XJTAG boundary scan system is an extremely powerful, versatile and cost effective product which has enabled ARM to improve and speed up the process of debugging and testing its RealView development tools. Spencer Saunders, Engineering Manager, Platforms, Development Systems – ARM Read case study

Worldline Atos case study header

The service from XJTAG is competitively priced and offers outstanding flexibility and competencies. The support provided to facilitate integration with LabVIEW makes XJTAG really stand out against other systems. Leone Alfano, Industrialization Test Specialist – Worldline Read case study

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